ECE students cracked GATE Exam 2017

ECE students cracked GATE Exam 2017

The department of Electronics & Communication Engineering proudly announces that two students,  Ms.Priya Garg and Ms.Mahak Mittal of the final year have cracked the GATE Exam 2017. Especially, Ms.Priya Garg performed exceptionally well by scoring 41.08 marks (AIR Р3989) which have been the highest ever secured marks by any student in the ECE discipline in the history of MIT.

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